X-ray characterization techniques for the assessment of...

Journal of Applied Physics 2013 Vol. 113; Iss. 12

X-ray characterization techniques for the assessment of surface damage in crystalline wafers: A model study in AlN

Bobea, M., Tweedie, J., Bryan, I., Bryan, Z., Rice, A., Dalmau, R., Xie, J., Collazo, R., Sitar, Z.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4798352
File:
PDF, 2.14 MB
english, 2013
Conversion to is in progress
Conversion to is failed