![](/img/cover-not-exists.png)
Evaluation of $V_{\rm ce}$ Monitoring as a Real-Time Method to Estimate Aging of Bond Wire-IGBT Modules Stressed by Power Cycling
Smet, Vanessa, Forest, François, Huselstein, Jean-Jacques, Rashed, Amgad, Richardeau, FrédéricVolume:
60
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2012.2196894
Date:
July, 2013
File:
PDF, 2.17 MB
english, 2013