Theory and Experiments of the Impact of Work-Function...

IEEE Transactions on Electron Devices 2012 / 11 Vol. 59; Iss. 11

Theory and Experiments of the Impact of Work-Function Variability on Threshold Voltage Variability in MOS Devices

Zhang, Xiao, Mitard, Jerome, Ragnarsson, Lars-Ake, Hoffmann, Tomas, Deal, Michael, Grubbs, Melody E., Li, Jing, Magyari-Kope, Blanka, Clemens, Bruce M., Nishi, Yoshio
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2012.2212021
Date:
November, 2012
File:
PDF, 305 KB
english, 2012
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