[IEEE 2009 Canadian Conference on Electrical and Computer Engineering (CCECE) - St. John's, NL, Canada (2009.05.3-2009.05.6)] 2009 Canadian Conference on Electrical and Computer Engineering - MOSFET model assessment for submicron and nanometer bulk-driven applications
Wang, Shaoxi, He, Rui, Zhang, LihongYear:
2009
Language:
english
DOI:
10.1109/CCECE.2009.5090297
File:
PDF, 367 KB
english, 2009