[IEEE 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2010) - West Lafayette, IN (2010.10.17-2010.10.20)] 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites
Sami, A, David, E, Fréchette, MYear:
2010
Language:
english
DOI:
10.1109/CEIDP.2010.5724069
File:
PDF, 375 KB
english, 2010