SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Interferometry XIII: Applications - Simultaneous measurement of deformation and thickness variation in polymer films
Morel, Eneas N., Torga, Jorge R., Novak, Erik L., Osten, Wolfgang, Gorecki, ChristopheVolume:
6293
Year:
2006
Language:
english
DOI:
10.1117/12.680546
File:
PDF, 243 KB
english, 2006