SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Infrared Technology and Applications XXXVII - A field-deployable spectral reflectometer to characterize surfaces in the infrared from the NIR to the LWIR
Moreau, Louis, Bourque, Hugo, Ouellet, Réal, Roy, Claude, Vallières, Christian, Thériault, Guillaume, Andresen, Bjørn F., Fulop, Gabor F., Norton, Paul R.Volume:
8012
Year:
2011
Language:
english
DOI:
10.1117/12.883546
File:
PDF, 1.01 MB
english, 2011