Electrostatic force microscopy as a broadly applicable...

Nanotechnology 2012 / 06 Vol. 23; Iss. 23

Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materials

Martin-Olmos, Cristina, Stieg, Adam Z, Gimzewski, James K
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Volume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/23/235701
Date:
June, 2012
File:
PDF, 880 KB
english, 2012
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