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SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - A fast digital image correlation algorithm based on Hartley transform and global sum-table scheme
Huang, Jianwei, Dong, Zhixue, Du, Zhengyu, Liu, BinVolume:
7820
Year:
2010
Language:
english
DOI:
10.1117/12.866262
File:
PDF, 642 KB
english, 2010