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[IEEE 4th International Conference on Solid-State and IC Technology - Beijing, China (24-28 Oct. 1995)] Proceedings of 4th International Conference on Solid-State and IC Technology - Study of the thermal annealing characteristic on SI-GaAs wafers

Guangping Li,, Qiongna Ru,, Jing Li,, Xiukun He,, Shenjun Nin,, Xiaobing Guo,
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Year:
1995
Language:
english
DOI:
10.1109/ICSICT.1995.500176
File:
PDF, 214 KB
english, 1995
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