SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Modeling, Systems Engineering, and Project Management for Astronomy V - One-shot focusing using the entropy as a merit function
Suc, V., Angeli, George Z., Dierickx, Philippe, Royo, S., Jordán, A., Bakos, G., Penev, K.Volume:
8449
Year:
2012
Language:
english
DOI:
10.1117/12.927021
File:
PDF, 1.18 MB
english, 2012