Enhanced sensitivity to dielectric function and thickness...

Enhanced sensitivity to dielectric function and thickness of absorbing thin films by combining total internal reflection ellipsometry with standard ellipsometry and reflectometry

Lizana, A, Foldyna, M, Stchakovsky, M, Georges, B, Nicolas, D, Garcia-Caurel, E
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
46
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/46/10/105501
Date:
March, 2013
File:
PDF, 1.79 MB
english, 2013
Conversion to is in progress
Conversion to is failed