Measurement and Analysis of Alpha-Particle-Induced Soft...

IEEE Transactions on Device and Materials Reliability 2014 / 03 Vol. 14; Iss. 1

Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple-Cell Upsets in 10T Subthreshold SRAM

Fuketa, Hiroshi, Harada, Ryo, Hashimoto, Masanori, Onoye, Takao
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2252430
Date:
March, 2014
File:
PDF, 366 KB
english, 2014
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