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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Effects of power bus stitching on signal integrity and thermal analysis
Ricchiuti, V., Illuminati, P., Orlandi, A., Antonini, G.Year:
2003
Language:
english
DOI:
10.1109/ICSMC2.2003.1428313
File:
PDF, 447 KB
english, 2003