Depth profile of the implantation-enhanced intermixing of Ga[sup +] focused ion beam in AlAs/GaAs quantum wells
Eshlaghi, Soheyla, Meier, C., Suter, Dieter, Reuter, D., Wieck, A. D.Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371720
File:
PDF, 281 KB
english, 1999