Fast frequency sweeping in resonance-tracking SPM for...

Nanotechnology 2012 / 12 Vol. 23; Iss. 49

Fast frequency sweeping in resonance-tracking SPM for high-resolution AFAM and PFM imaging

Enriquez-Flores, C I, Gervacio-Arciniega, J J, Cruz-Valeriano, E, de Urquijo-Ventura, P, Gutierrez-Salazar, B J, Espinoza-Beltran, F J
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Volume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/49/495705
Date:
December, 2012
File:
PDF, 1.43 MB
english, 2012
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