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[IEEE 2012 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, Jilin, China (2012.08.23-2012.08.25)] 2012 International Conference on Optoelectronics and Microelectronics - The experiment of a system for measurements of the refractive index structure constant along a 1 km free-space laser propagation path

Ren, Zhipeng, Cui, Guangcai, Chen, Chunyi
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Year:
2012
Language:
english
DOI:
10.1109/ICoOM.2012.6316280
File:
PDF, 606 KB
english, 2012
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