Thermoelectric transport and Hall measurements of low...

Semiconductor Science and Technology 2013 / 03 Vol. 28; Iss. 3

Thermoelectric transport and Hall measurements of low defect Sb 2 Te 3 thin films grown by atomic layer deposition

Zastrow, S, Gooth, J, Boehnert, T, Heiderich, S, Toellner, W, Heimann, S, Schulz, S, Nielsch, K
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Volume:
28
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/28/3/035010
Date:
March, 2013
File:
PDF, 871 KB
english, 2013
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