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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Studies of a colorimetric array consisted of metalloporphrins and Pt complexes
Luo, Jing, Ma, Tengshuang, Li, Lu, Pan, Pinghua, Xu, Jianhua, Jiang, Yadong, Yang, Yajie, Jiang, Ya-Dong, Kippelen, Bernard, Yu, JunshengVolume:
7658
Year:
2010
Language:
english
Pages:
1
DOI:
10.1117/12.866608
File:
PDF, 337 KB
english, 2010