Leakage mechanisms in BiFeO[sub 3] thin films
Pabst, Gary W., Martin, Lane W., Chu, Ying-Hao, Ramesh, R.Volume:
90
Year:
2007
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2535663
File:
PDF, 679 KB
english, 2007