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[IEEE 13th IEEE International Semiconductor Laser Conference - Kagazwa, Japan (Sept. 21-25, 1992)] 13th IEEE International Semiconductor Laser Conference - Cross-correlation measurements of intensity noise from the two facets of DFB lasers during linewidth rebroadening
Goobar, E., Rigole, P., Schatz, R.Year:
1992
Language:
english
Pages:
2
DOI:
10.1109/ISLC.1992.763665
File:
PDF, 191 KB
english, 1992