![](/img/cover-not-exists.png)
Designs of Mixed Resolution for Process Robustness Studies
Borkowski, John J., Lucas, James M.Volume:
39
Language:
english
Pages:
8
Journal:
Technometrics
DOI:
10.1080/00401706.1997.10485440
Date:
February, 1997
File:
PDF, 927 KB
english, 1997