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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - CCD non-uniformity effects on position accuracy of star sensor
Liao, Jia-li, Liu, Hai-bo, Jia, Hui, Yang, Jian-kun, Tan, Ji-chun, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
Pages:
1
DOI:
10.1117/12.865553
File:
PDF, 238 KB
english, 2010