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SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - High accuracy star image locating and imaging calibration for star sensor technology
Zhang, Shaodi, Zhang, Zhijun, Sun, Honghai, Wang, Yanjie, Tan, Jiubin, Wen, XianfangVolume:
7544
Year:
2010
Language:
english
Pages:
1
DOI:
10.1117/12.885374
File:
PDF, 483 KB
english, 2010