[IEEE 2010 International Conference on Electronic Devices, Systems and Applications (ICEDSA) - Kuala Lumpur, Malaysia (2010.04.11-2010.04.14)] 2010 International Conference on Electronic Devices, Systems and Applications - Failure mechanism of silicon germanium (SiGe) technology on 90nm PMOS
Ismail, L.N, Pawet, M.A, Mohamad Saad, P.S, Zoolfakar, A.SYear:
2010
Language:
english
Pages:
5
DOI:
10.1109/ICEDSA.2010.5503042
File:
PDF, 405 KB
english, 2010