[IEEE IEEE International Electron Devices Meeting 2003 -...

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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Soft error immune 0.46 μm/sup 2/ SRAM cell with MIM node capacitor by 65 nm CMOS technology for ultra high speed SRAM

Soon-Moon Jung,, Hoon Lim,, Wonseok Cho,, Hoosung Cho,, Hatae Hong,, Jaehun Jeong,, Sugwoo Jung,, Hanbyung Park,, Byoungkeun Son,, Youngchul Jang,, Kinam Kim,
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Year:
2003
Language:
english
DOI:
10.1109/IEDM.2003.1269281
File:
PDF, 282 KB
english, 2003
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