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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Power Aware Embedded Test
Lin, Xijiang, Moghaddam, Elham, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Tyszer, JerzyYear:
2011
DOI:
10.1109/ATS.2011.49
File:
PDF, 1.50 MB
2011