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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating
Moghaddam, Elham K., Rajski, Janusz, Reddy, Sudhakar M., Janicki, JakubYear:
2011
Language:
english
DOI:
10.1109/ATS.2011.46
File:
PDF, 290 KB
english, 2011