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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Technological (domino effect) and natural hazards: A probabilistic framework for structural vulnerability
Mebarki, Ahmed, Baroth, Julien, Mercier, FredericYear:
2010
Language:
english
DOI:
10.1109/ICRESH.2010.5779629
File:
PDF, 1.05 MB
english, 2010