![](/img/cover-not-exists.png)
Analysis of stray capacitance in the Kelvin method
Baikie, I. D., Venderbosch, E., Meyer, J. A., Estrup, P. J. Z.Volume:
62
Year:
1991
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1142075
File:
PDF, 1.42 MB
english, 1991