Analysis of stray capacitance in the Kelvin method

Baikie, I. D., Venderbosch, E., Meyer, J. A., Estrup, P. J. Z.

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Volume:

Year:

1991

Language:

english

Journal:

Review of Scientific Instruments

DOI:

10.1063/1.1142075

File:

PDF, 1.42 MB

english, 1991

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