[IEEE Comput. Soc Design, Automation and Test in Europe...

  • Main
  • [IEEE Comput. Soc Design, Automation...

[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - Diagnosis of scan-chains by use of a configurable signature register and error-correcting codes

Leininger, A., Goessel, M., Muhmenthaler, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2004
Language:
english
DOI:
10.1109/DATE.2004.1269075
File:
PDF, 293 KB
english, 2004
Conversion to is in progress
Conversion to is failed