[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - Diagnosis of scan-chains by use of a configurable signature register and error-correcting codes
Leininger, A., Goessel, M., Muhmenthaler, P.Year:
2004
Language:
english
DOI:
10.1109/DATE.2004.1269075
File:
PDF, 293 KB
english, 2004