Diffraction analysis of internal strain-stress fields in...

Philosophical Magazine A 2001 / 03 Vol. 81; Iss. 3

Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: Theoretical basis and simulation

Leoni, M., Welzel, U., Lamparter, P., Mittemeijer, E. J., Kamminga, J.-D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
81
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418610108212161
Date:
March, 2001
File:
PDF, 1.40 MB
english, 2001
Conversion to is in progress
Conversion to is failed