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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Adaptive Low Shift Power Test Pattern Generator for Logic BIST
Lin, Xijiang, Rajski, JanuszYear:
2010
Language:
english
DOI:
10.1109/ATS.2010.67
File:
PDF, 252 KB
english, 2010