![](/img/cover-not-exists.png)
[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A generic low power scan chain wrapper for designs using scan compression
Sabne, Amit, Tiwari, Rajesh, Shrivastava, Abhijeet, Ravi, Srivaths, Parekhji, RubinYear:
2010
Language:
english
DOI:
10.1109/VTS.2010.5469593
File:
PDF, 706 KB
english, 2010