[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA,...

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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A generic low power scan chain wrapper for designs using scan compression

Sabne, Amit, Tiwari, Rajesh, Shrivastava, Abhijeet, Ravi, Srivaths, Parekhji, Rubin
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Year:
2010
Language:
english
DOI:
10.1109/VTS.2010.5469593
File:
PDF, 706 KB
english, 2010
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