[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Power-safe test application using an effective gating approach considering current limits
Zhao, Wei, Tehranipoor, Mohammad, Chakravarty, SreejitYear:
2011
Language:
english
DOI:
10.1109/VTS.2011.5783777
File:
PDF, 4.09 MB
english, 2011