[IEEE 2011 IEEE 10th International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom) - Changsha, China (2011.11.16-2011.11.18)] 2011IEEE 10th International Conference on Trust, Security and Privacy in Computing and Communications - Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination
Mei, Chunlei, Yi, Maoxiang, Shen, ZhifeiYear:
2011
Language:
english
DOI:
10.1109/TrustCom.2011.90
File:
PDF, 284 KB
english, 2011