Photo-induced transient spectroscopy of defect levels in GaInNAs
Erol, A, Mazzucato, S, Arikan, M, Carr re, H, Arnoult, A, Bedel, E, Balkan, NVolume:
18
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/18/11/311
Date:
November, 2003
File:
PDF, 214 KB
english, 2003