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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - A new low power test pattern generator using a variable-length ring counter
Zhou, Bin, Ye, Yi-zheng, Li, Zhao-lin, Wu, Xin-chun, Ke, RuiYear:
2009
Language:
english
DOI:
10.1109/ISQED.2009.4810302
File:
PDF, 886 KB
english, 2009