Interface width evaluation in thin layered CoFeB/MgO...

Thin Solid Films 2013 / 4 Vol. 533

Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity

Lamperti, A., Ahn, S.-M., Ocker, B., Mantovan, R., Ravelosona, D.
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Volume:
533
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.11.130
Date:
April, 2013
File:
PDF, 604 KB
english, 2013
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