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[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - OPERA: optimization with ellipsoidal uncertainty for robust analog IC design
Yang Xu,, Xin Li,, Kan-Lin Hsiung,, Boyd, S., Nausieda, I.Year:
2005
Language:
english
DOI:
10.1109/DAC.2005.193888
File:
PDF, 1.09 MB
english, 2005