Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry
Warren, Kevin M., Sternberg, Andrew L., Weller, Robert A., Baze, Mark P., Massengill, Lloyd W., Reed, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D.Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2006481
Date:
December, 2008
File:
PDF, 556 KB
english, 2008