[IEEE 2010 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2010.06.16-2010.06.18)] 2010 Symposium on VLSI Circuits - A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element
Furuta, Jun, Ham, Chikara, Kobayashi, Kazutoshi, Onodera, HidetoshiYear:
2010
Language:
english
DOI:
10.1109/VLSIC.2010.5560329
File:
PDF, 392 KB
english, 2010