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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - A nonuniform thermal de-embedding approach for cryogenic on-wafer high-frequency noise measurements
Delcourt, S., Dambrine, G., Bourzgui, N.E., Lepilliet, S., Laporte, C., Fraysse, J.-P., Maignan, M.Year:
2004
Language:
english
DOI:
10.1109/MWSYM.2004.1338954
File:
PDF, 427 KB
english, 2004