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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Segment based X-Filling for low power and high defect coverage
Chen, Zhen, Xiang, Dong, Yin, BoXueYear:
2009
Language:
english
DOI:
10.1109/VDAT.2009.5158159
File:
PDF, 215 KB
english, 2009