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[IEEE 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Bangkok, Thailand (2012.12.3-2012.12.5)] 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) - The sensitivity analysis of the effect of single-event-upset on low-swing signaling driver
Mahyuddin, Nor Muzlifah, Russell, GordonYear:
2012
Language:
english
DOI:
10.1109/EDSSC.2012.6482817
File:
PDF, 229 KB
english, 2012