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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors
Ulbricht, Markus, Scholzel, Mario, Koal, Tobias, Vierhaus, Heinrich TheodorYear:
2011
Language:
english
DOI:
10.1109/DDECS.2011.5783067
File:
PDF, 677 KB
english, 2011