[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - DART: Dependable VLSI test architecture and its implementation
Sato, Yasuo, Kajihara, Seiji, Yoneda, Tomokazu, Hatayama, Kazumi, Inoue, Michiko, Miura, Yukiya, Untake, Satosni, Hasegawa, Takumi, Sato, Motoyuki, Shimamura, KotaroYear:
2012
Language:
english
DOI:
10.1109/TEST.2012.6401581
File:
PDF, 986 KB
english, 2012