Characterization and Parasitic Extraction of EMI Filters Using Scattering Parameters
Wang, S., Lee, F.C., Odendaal, W.G.Volume:
20
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2004.842949
Date:
March, 2005
File:
PDF, 933 KB
english, 2005