Drain Current DLTS of AlGaN–GaN MIS-HEMTs
Okino, T., Ochiai, M., Ohno, Y., Kishimoto, S., Maezawa, K., Mizutani, T.Volume:
25
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2004.832788
Date:
August, 2004
File:
PDF, 174 KB
english, 2004