Heavy Ion Energy Effects in CMOS SRAMs

IEEE Transactions on Nuclear Science 2007 / 08 Vol. 54; Iss. 4

Heavy Ion Energy Effects in CMOS SRAMs

Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Hash, G. L., Felix, J. A., Hirose, K., Saito, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2007.893425
Date:
August, 2007
File:
PDF, 346 KB
english, 2007
Conversion to is in progress
Conversion to is failed